In situ measurement of bulk modulus and yield response of...

Journal of Materials Research 2020 / 03 Vol. 35; Iss. 6

In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression - ERRATUM

Brazil, Owen, de Silva, Johann P., Chowdhury, Mithun, Yoon, Heedong, McKenna, Gregory B., Oliver, Warren C., Kilpatrick, Jason, Pethica, John B., Cross, Graham L.W.
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Volume:
35
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2020.67
Date:
March, 2020
File:
PDF, 55 KB
2020
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