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[IEEE 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Grenoble, France (2019.4.1-2019.4.3)] 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Back-bias impact on variability and BTI for 3D-monolithic 14nm FDSOI SRAMs applications

Bosch, D., Andrieu, F., Garros, X., Ciampolini, L., Makosiej, A., Weber, O., Lacord, J., Cluzel, J., Giraud, B., Cibrario, G., Brunet, L., Batude, P., Fenouillet-Beranger, C., Lattard, D., Colinge, J.
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Year:
2019
Language:
english
DOI:
10.1109/EUROSOI-ULIS45800.2019.9041890
File:
PDF, 544 KB
english, 2019
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