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[IEEE 2019 IEEE International Symposium on Workload Characterization (IISWC) - Orlando, FL, USA (2019.11.3-2019.11.5)] 2019 IEEE International Symposium on Workload Characterization (IISWC) - Multi-Bit Upsets Vulnerability Analysis of Modern Microprocessors
Chatzidimitriou, Athanasios, Papadimitriou, George, Gavanas, Christos, Katsoridas, George, Gizopoulos, DimitrisYear:
2019
Language:
english
DOI:
10.1109/IISWC47752.2019.9042036
File:
PDF, 1.21 MB
english, 2019