![](/img/cover-not-exists.png)
[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - Characterization of 1122nm Laser for Laser Based Fault Isolation Applications
Somasundaram, Vasanth, Xuan, Seah Yi, Phoa, Angeline, Lua, Winson, Meng, Chua Choon, Krishnan Ravikumar, VenkatYear:
2019
Language:
english
DOI:
10.1109/ipfa47161.2019.8984804
File:
PDF, 9.04 MB
english, 2019