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[IEEE 2018 4th IEEE International Conference on Emerging Electronics (ICEE) - Bengaluru, India (2018.12.17-2018.12.19)] 2018 4th IEEE International Conference on Emerging Electronics (ICEE) - SIMS characterization of TiN diffusion barrier layer on steel substrate
Kumar, Pankaj, Arvind, Jithin M., Mohan, S., Avasthi, SushobhanYear:
2018
Language:
english
DOI:
10.1109/icee44586.2018.8937939
File:
PDF, 2.67 MB
english, 2018