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[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - A Comprehensive Evaluation of the Effects of Input Data on the Resilience of GPU Applications
Previlon, Fritz G., Kalra, Charu, Kaeli, David R., Rech, PaoloYear:
2019
Language:
english
DOI:
10.1109/dft.2019.8875269
File:
PDF, 238 KB
english, 2019