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[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - Probing SRAM Signals for Yield Management
Johnson, Gregory M., Rummel, Andreas, Kemmler, Matthias, Lundquist, Ted, Nui, BaohuaYear:
2019
Language:
english
DOI:
10.1109/ipfa47161.2019.8984901
File:
PDF, 1.06 MB
english, 2019