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[IEEE 2019 IEEE International Superconductive Electronics Conference (ISEC) - Riverside, CA, USA (2019.7.28-2019.8.1)] 2019 IEEE International Superconductive Electronics Conference (ISEC) - Computational Analysis of Defect Signals of All-Round Pipe Inspection using HTS-SQUID-based Guided Wave Testing
Azuma, Yuki, Hatsukade, YoshimiYear:
2019
Language:
english
DOI:
10.1109/isec46533.2019.8990918
File:
PDF, 1.24 MB
english, 2019