Fine-grained analysis method for Android volatile memory

Fine-grained analysis method for Android volatile memory

Feng, Peijun, Li, Qingbao, Chen, Zhifeng
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Volume:
715
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/715/1/012043
Date:
January, 2020
File:
PDF, 900 KB
english, 2020
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