Fine-grained analysis method for Android volatile memory
Feng, Peijun, Li, Qingbao, Chen, ZhifengVolume:
715
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/715/1/012043
Date:
January, 2020
File:
PDF, 900 KB
english, 2020