[IEEE 2019 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2019.10.13-2019.10.17)] 2019 IEEE International Integrated Reliability Workshop (IIRW) - Compact Model of the Entire I-V Characteristic for Accurate Description of the Asymmetric Degradation of pMOSFETs during Off-State Stress

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