[IEEE 2019 IEEE Radiation Effects Data Workshop (IEEE) (in conjunction with NSREC 2019) - San Antonio, TX, USA (2019.7.8-2019.7.12)] 2019 IEEE Radiation Effects Data Workshop - Heavy Ion Single Event Latchup Measurements of a Focal Plane Imager at Room and Cryogenic Temperatures
Irom, Farokh, Allen, Gregory R., Hancock, Bruce R., Mariani, GiacomoYear:
2019
Language:
english
DOI:
10.1109/redw.2019.8906536
File:
PDF, 261 KB
english, 2019