[IEEE 2019 IEEE 28th Asian Test Symposium (ATS) - Kolkata, India (2019.12.10-2019.12.13)] 2019 IEEE 28th Asian Test Symposium (ATS) - TEA: A Test Generation Algorithm for Designs with Timing Exceptions
Wang, Naixing, Wang, Chen, Tsai, Kun-Han, Cheng, Wu-Tung, Lin, Xijiang, Kassab, Mark, Pomeranz, IrithYear:
2019
Language:
english
DOI:
10.1109/ats47505.2019.000-6
File:
PDF, 7.99 MB
english, 2019