[IEEE IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society - Lisbon, Portugal (2019.10.14-2019.10.17)] IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society - A Junction Temperature-based PSpice Short-circuit Model of SiC MOSFET Considering Leakage Current
Li, Hong, Wang, Yuting, Zhao, Xingran, Sun, Kai, Zhou, Zhe, Xu, YunfeiYear:
2019
Language:
english
DOI:
10.1109/iecon.2019.8927663
File:
PDF, 4.32 MB
english, 2019