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[IEEE 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Beijing, China (2018.5.16-2018.5.18)] 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Total Dose Effects on Novel Al/TiO 2 /n-Ge Metal-Insulator-Semiconductor Contacts under Gamma-ray Irradiation
Zhang, Yi, Han, Genquan, Shan, Hengsheng, Liu, Yan, Zhang, Jincheng, Hao, YueYear:
2018
Language:
english
DOI:
10.1109/icreed.2018.8905077
File:
PDF, 1.73 MB
english, 2018