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Effect of the Degree of the Gate-Dielectric Surface Roughness on the Performance of Bottom-Gate Organic Thin-Film Transistors
Geiger, Michael, Acharya, Rachana, Reutter, Eric, Ferschke, Thomas, Zschieschang, Ute, Weis, Jürgen, Pflaum, Jens, Klauk, Hagen, Weitz, Ralf ThomasLanguage:
english
Journal:
Advanced Materials Interfaces
DOI:
10.1002/admi.201902145
Date:
March, 2020
File:
PDF, 2.31 MB
english, 2020