Improvement in Electrical Characteristics of ZnSnO/Si...

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IEEE Journal of the Electron Devices Society 2020

Improvement in Electrical Characteristics of ZnSnO/Si Bilayer TFET by W/Al2O3 Gate Stack

Kato, Kimihiko, Matsui, Hiroaki, Tabata, Hitoshi, Mori, Takahiro, Morita, Yukinori, Matsukawa, Takashi, Takenaka, Mitsuru, Takagi, Shinichi
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Year:
2020
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2020.2982424
File:
PDF, 9.10 MB
english, 2020
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