[IEEE 2018 16th Biennial Baltic Electronics Conference...

  • Main
  • [IEEE 2018 16th Biennial Baltic...

[IEEE 2018 16th Biennial Baltic Electronics Conference (BEC) - Tallinn (2018.10.8-2018.10.10)] 2018 16th Biennial Baltic Electronics Conference (BEC) - The measurement and tuning of SiC Diode Voltage Doubler represented as diffusion-welded stack.

Toompuu, Jana, Sleptsuk, Natalja, Land, Raul, Korolkov, Oleg, Rang, Toomas
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2018
DOI:
10.1109/bec.2018.8600963
File:
PDF, 575 KB
2018
Conversion to is in progress
Conversion to is failed