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[IEEE 2018 16th Biennial Baltic Electronics Conference (BEC) - Tallinn (2018.10.8-2018.10.10)] 2018 16th Biennial Baltic Electronics Conference (BEC) - The measurement and tuning of SiC Diode Voltage Doubler represented as diffusion-welded stack.
Toompuu, Jana, Sleptsuk, Natalja, Land, Raul, Korolkov, Oleg, Rang, ToomasYear:
2018
DOI:
10.1109/bec.2018.8600963
File:
PDF, 575 KB
2018