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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2020

Additive Statistical Leakage Analysis Using Exponential Mixture Model

Kwon, Hyunjeong, Lee, Sung-Yun, Kim, Young Hwan, Kang, Seokhyeong
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Year:
2020
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2020.2975154
File:
PDF, 2.63 MB
english, 2020
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