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[IEEE 2019 IEEE 3rd Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) - Chongqing, China (2019.10.11-2019.10.13)] 2019 IEEE 3rd Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) - A vertical impact testing machine based on LabVIEW
Gao, Zhen, Jiang, Shubo, Zhou, BinYear:
2019
Language:
english
DOI:
10.1109/IMCEC46724.2019.8983934
File:
PDF, 5.28 MB
english, 2019