SF 6 fault decomposition...

IEEE Transactions on Dielectrics and Electrical Insulation 2020 / 4 Vol. 27; Iss. 2

SF 6 fault decomposition feature component extraction and triangle fault diagnosis method

Zeng, Fuping, Wu, Siying, Lei, Zhicheng, Li, Chen, Tang, Ju, Yao, Qiang, Miao, Yulong
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Volume:
27
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/TDEI.2019.008370
Date:
April, 2020
File:
PDF, 5.75 MB
english, 2020
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