Reliability Characterization of Ring Oscillator Circuits...

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IEEE Transactions on Device and Materials Reliability 2020

Reliability Characterization of Ring Oscillator Circuits for Advanced CMOS Technologies

Kerber, A., Nigam, T., Paliwoda, P., Guarin, F.
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Year:
2020
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2020.2981010
File:
PDF, 7.66 MB
english, 2020
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