Magnetic depth profiling of the Co/C60 interface through...

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IEEE Transactions on Magnetics 2020

Magnetic depth profiling of the Co/C60 interface through soft X-ray resonant magnetic reflectivity

Verna, Adriano, Bergenti, Ilaria, Pasquali, Luca, Giglia, Angelo, Albonetti, Cristiano, Dediu, Valentin, Borgatti, Francesco
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Year:
2020
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/TMAG.2020.2981927
File:
PDF, 6.68 MB
english, 2020
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