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[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - A New Test Method for the Large Current Magnetic Sensors

Omuro, Toshiyuki, Surname, Shigeo Nakamura, Kimura, Takashi, Omuro, Toshiyuki
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Year:
2019
Language:
english
DOI:
10.1109/itc44170.2019.9000142
File:
PDF, 6.02 MB
english, 2019
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