[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - IEEE European Test Symposium (ETS)
Eggersgluss, Stephan, Hamdioui, Said, Jutman, Artur, Michael, Maria K., Raik, Jaan, Reorda, Matteo Sonza, Tahoori, Mehdi, Vatajelu, Elena-IoanaYear:
2019
Language:
english
DOI:
10.1109/itc44170.2019.9000148
File:
PDF, 8.29 MB
english, 2019