Characterization and Image-Based Performance Evaluation on the Longevity of LCDs Under High Temperature and Humid Environment
Chang, Yu-Kai, Chen, Kuo-Shen, Chen, Chun-ChihVolume:
20
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2019.2957422
Date:
March, 2020
File:
PDF, 155 KB
english, 2020