[IEEE 2019 IEEE 37th VLSI Test Symposium (VTS) - Monterey,...

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[IEEE 2019 IEEE 37th VLSI Test Symposium (VTS) - Monterey, CA, USA (2019.4.23-2019.4.25)] 2019 IEEE 37th VLSI Test Symposium (VTS) - Special Session: A Quality and Reliability Driven DFT and DFR Strategy for Automotive and Industrial Markets

Shah, Malav, Ghosh, Subhadeep, Martin, Scott
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Year:
2019
Language:
english
DOI:
10.1109/vts.2019.8758640
File:
PDF, 610 KB
english, 2019
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