[IEEE 2019 IEEE 37th VLSI Test Symposium (VTS) - Monterey, CA, USA (2019.4.23-2019.4.25)] 2019 IEEE 37th VLSI Test Symposium (VTS) - Special Session: A Quality and Reliability Driven DFT and DFR Strategy for Automotive and Industrial Markets
Shah, Malav, Ghosh, Subhadeep, Martin, ScottYear:
2019
Language:
english
DOI:
10.1109/vts.2019.8758640
File:
PDF, 610 KB
english, 2019