A new method for detecting surface defects on curved reflective optics using normalized reflectivity
Du, Hui-Lin, Zhang, Wen-Hao, Ju, Bing-Feng, Sun, Zeqing, Sun, AnyuVolume:
91
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5100851
Date:
March, 2020
File:
PDF, 2.83 MB
english, 2020