Impact of Dimensions of Memory Periphery FinFETs on Bias Temperature Instability
Boubaaya, M., OrSullivan, BJ., Djezzar, B., Franco, J., Litta, ED., Ritzenthaler, R., Dupuy, E., Machkaoutsan, V., Fazan, P., Kim, C., Bennaceur-Doumaz, D., Hamida, A. Ferhat, Spessot, A., Linten, D.,Year:
2020
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2020.2984957
File:
PDF, 2.25 MB
english, 2020
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