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Real-time test-bed system development using power hardware-in-the-loop (PHIL) simulation technique for reliability test of DC nano grid
Heo, Kyung-Wook, Choi, Hyun-Jun, Jung, Jee-HoonVolume:
20
Journal:
Journal of Power Electronics
DOI:
10.1007/s43236-020-00075-x
Date:
May, 2020
File:
PDF, 2.07 MB
2020