Impact of electrical stress and neutron irradiation on reliability of silicon carbide power MOSFET
Niskanen, K., Touboul, A. D., Germanicus, R. Coq, Michez, A., Javanainen, A., Wrobel, F., Boch, J., Pouget, V., Saigne, F.Year:
2020
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2020.2983599
File:
PDF, 1.12 MB
2020