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Determination of carrier lifetime in thermally evaporated In2S3 thin films by light induced transient grating technique
Rasool, S., Â Å Äajev, P., Saritha, K., Svito, I., Reddy, K. T. Ramakrishna, Â Tivanov, M. S., Grivickas, V.Volume:
126
Journal:
Applied Physics A
DOI:
10.1007/s00339-020-03495-5
Date:
April, 2020
File:
PDF, 2.13 MB
2020