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Journal of Electronic Testing 2020 / 4

Automated Bug Resistant Test Intent with Register Header Database for Optimized Verification

Sharma, Gaurav, Bhargava, Lava, Kumar, Vinod
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Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-020-05866-5
Date:
April, 2020
File:
PDF, 3.49 MB
2020
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