Electron-Beam-Induced Current Study of Dislocations and...

  • Main
  • 2020 / 3
  • Electron-Beam-Induced Current Study of Dislocations and...
Journal of Electronic Materials 2020 / 3

Electron-Beam-Induced Current Study of Dislocations and Leakage Sites in GaN Schottky Barrier Diodes

Chen, Jun, Yi, Wei, Kumar, Ashutosh, Iwanade, Akio, Tanaka, Ryo, Takashima, Shinya, Edo, Masaharu, Ito, Shun, Kimura, Takashi, Ohkubo, Tadakatsu, Sekiguchi, Takashi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-020-08081-2
Date:
March, 2020
File:
PDF, 1.89 MB
2020
Conversion to is in progress
Conversion to is failed