Microstructural characterization of cold-drawn Cu–Ni–Si...

Microstructural characterization of cold-drawn Cu–Ni–Si alloy having high strength and high conductivity

Kim, Hwangsun, Ahn, Jee Hyuk, Han, Seung Zeon, Jo, Janghyun, Baik, Hionsuck, Kim, Miyoung, Han, Heung Nam
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Volume:
832
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2020.155059
Date:
August, 2020
File:
PDF, 3.80 MB
2020
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