Analysis of thin germanium-rich SiGe layers on Si(1 1 1)...

Journal of Crystal Growth 2020 / 04 Vol. 535

Analysis of thin germanium-rich SiGe layers on Si(1 1 1) substrates grown by carbon-mediated epitaxy

Genath, Hannah, Schmidt, Jan, Osten, H. Jörg
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Volume:
535
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2020.125569
Date:
April, 2020
File:
PDF, 650 KB
2020
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