Effects of current transportation and deep traps on leakage...

Materials Science in Semiconductor Processing 2020 / 08 Vol. 115

Effects of current transportation and deep traps on leakage current and capacitance hysteresis of AlGaN/GaN HEMT

Saadaoui, Salah, Fathallah, Olfa, Maaref, Hassen
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
115
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2020.105100
Date:
August, 2020
File:
PDF, 1.84 MB
2020
Conversion to is in progress
Conversion to is failed