Pulsed Force Kelvin Probe Force Microscopy

ACS Nano 2020 / 04 Vol. 14; Iss. 4

Pulsed Force Kelvin Probe Force Microscopy

Jakob, Devon S., Wang, Haomin, Xu, Xiaoji G.
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Volume:
14
Journal:
ACS Nano
DOI:
10.1021/acsnano.0c00767
Date:
April, 2020
File:
PDF, 1.27 MB
2020
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