Electron-spin-resonance and electrically...

Journal of Applied Physics 2020 / 04 Vol. 127; Iss. 14

Electron-spin-resonance and electrically detected-magnetic-resonance characterization on P bC center in various 4H-SiC(0001)/SiO 2 interfaces

Umeda, T., Nakano, Y., Higa, E., Okuda, T., Kimoto, T., Hosoi, T., Watanabe, H., Sometani, M., Harada, S.
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Volume:
127
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5134648
Date:
April, 2020
File:
PDF, 1.54 MB
2020
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