In-plane micro-displacement measurement based on secondary...

AIP Advances 2020 / 04 Vol. 10; Iss. 4

In-plane micro-displacement measurement based on secondary diffraction

Liu, Shengrun, Xue, Bin, Yu, Jirui, Xu, Guangzhou, Lv, Juan, Cheng, Ying, Yang, Jianfeng
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Volume:
10
Journal:
AIP Advances
DOI:
10.1063/1.5143339
Date:
April, 2020
File:
PDF, 5.36 MB
2020
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