Development of a high resolution x-ray inspection system...

Review of Scientific Instruments 2020 / 04 Vol. 91; Iss. 4

Development of a high resolution x-ray inspection system using a carbon nanotube based miniature x-ray tube

Kim, Hyun Nam, Jeong, Heon Young, Lee, Ju Hyuk, Cho, Sung Oh
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Volume:
91
Journal:
Review of Scientific Instruments
DOI:
10.1063/5.0003229
Date:
April, 2020
File:
PDF, 3.55 MB
2020
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