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[IEEE 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Grenoble, France (2019.4.1-2019.4.3)] 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - RF Characterization of 28 nm FD-SOI Transistors Up to 220 GHz
Deng, Marina, Fregonese, Sebastien, Dorrnieu, Benjamin, Scheer, Patrick, De Matos, Magali, Zimmer, ThomasYear:
2019
DOI:
10.1109/EUROSOI-ULIS45800.2019.9041884
File:
PDF, 6.22 MB
2019