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[IEEE 2019 19th Non-Volatile Memory Technology Symposium (NVMTS) - Durham, NC, USA (2019.10.28-2019.10.30)] 2019 19th Non-Volatile Memory Technology Symposium (NVMTS) - True random number generation exploiting SET voltage variability in resistive RAM memory arrays
Postel-Pellerin, Jeremy, Bazzi, Hussein, Aziza, Hassen, Canet, Pierre, Moreau, Mathieu, Marca, Vincenzo Della, Harb, AdnanYear:
2019
DOI:
10.1109/NVMTS47818.2019.9043369
File:
PDF, 1.23 MB
2019