Electric-Based Thermal Characterization of GaN Technologies...

IEEE Transactions on Electron Devices 2020 / 5 Vol. 67; Iss. 5

Electric-Based Thermal Characterization of GaN Technologies Affected by Trapping Effects

Bremer, Johan, Chen, Ding Yuan, Malko, Aleksandra, Madel, Manfred, Rorsman, Niklas, Gunnarsson, Sten E., Andersson, Kristoffer, Nilsson, Torbjorn M. J., Raad, Peter E., Komarov, Pavel L., Sandy, Travi
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Volume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2983277
Date:
May, 2020
File:
PDF, 2.24 MB
2020
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