A Practical Inductor Loss Testing Scheme and Device with...

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IEEE Transactions on Industrial Electronics 2020

A Practical Inductor Loss Testing Scheme and Device with High Frequency PWM Excitations

Liu, Baiyi, Chen, Wei, Wang, JingHui, Chen, QingBin
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Year:
2020
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/TIE.2020.2984985
File:
PDF, 2.56 MB
2020
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