High-Frequency Noise Characterization and Modeling of...

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IEEE Transactions on Microwave Theory and Techniques 2020

High-Frequency Noise Characterization and Modeling of Graphene Field-Effect Transistors

Deng, Marina, Fadil, Dalal, Wei, Wei, Pallecchi, Emiliano, Happy, Henri, Dambrine, Gilles, De Matos, Magali, Zimmer, Thomas, Fregonese, Sebastien
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Year:
2020
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2020.2982396
File:
PDF, 13.94 MB
2020
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