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Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits
Cai, Chang, He, Ze, Liu, Tianqi, Chen, Gengsheng, Yu, Jian, Xu, Liewei, Liu, JieVolume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/access.2020.2978201
File:
PDF, 8.47 MB
2020