[IEEE 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Richland, WA, USA (2019.10.20-2019.10.23)] 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Modelling the Effect of Charge Transport on Surface Flashover in Vacuum
Pan, Shaoming, Chen, George, Wang, Xiaoping, Li, ShengtaoYear:
2019
DOI:
10.1109/ceidp47102.2019.9009905
File:
PDF, 2.21 MB
2019