[IEEE 2019 IEEE 8th Data Driven Control and Learning...

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[IEEE 2019 IEEE 8th Data Driven Control and Learning Systems Conference (DDCLS) - Dali, China (2019.5.24-2019.5.27)] 2019 IEEE 8th Data Driven Control and Learning Systems Conference (DDCLS) - A Variable Selection Method for Fault Isolation through Bayesian Information Criterion

Liu, Lang, Yang, Weidong, Zhang, Hong, Fan, Huijin, Tao, Bo
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Year:
2019
DOI:
10.1109/ddcls.2019.8909044
File:
PDF, 3.16 MB
2019
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