[IEEE 2019 Device Research Conference (DRC) - Ann Arbor,...

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[IEEE 2019 Device Research Conference (DRC) - Ann Arbor, MI, USA (2019.6.23-2019.6.26)] 2019 Device Research Conference (DRC) - Impact Ionization Model for S-NDR based Threshold Switching Devices

Zou, Yuezhang, Gala, Darshil K., Bain, James A.
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Year:
2019
DOI:
10.1109/drc46940.2019.9046347
File:
PDF, 349 KB
2019
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