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[IEEE 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2020.1.27-2020.1.30)] 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Experimental and TCAD Study of Breakdown Voltage Enhancement of high-voltage MOSFETs
Amelin, Yury V., Krasukov, Anton Y., Artamonova, Evgeniya A.Year:
2020
DOI:
10.1109/eiconrus49466.2020.9039032
File:
PDF, 1.77 MB
2020